Precision Measurement Laser Confocal Microscope
Specifications
Specifications and Parameters
System Configuration
| Product Overview
LEXT ™ OLS5500 it has two Optics systems: color imaging system and Laser confocal system, which can be used to collect color information, topography information and high-resolution images
color imaging
the color imaging Optics system collects information through a white LED light source and a Complementary Metal‑Oxide‑Semiconductor Image Sensor. This makes the color reproduction accurate and the surface features clearly visible.
3D topography information and high Resolution images
laser confocal Optics system for confocal image acquisition using 405 nm Laser diode light source and high sensitivity Photomultiplier Tube (PMT) in white light interferometry (WLI), the height information is obtained by Reflection the Interference Stria generated from the sample surface and the reference mirror surface after the white light source is divided into two beams by the beam splitter in the Objective focus change imaging (FV) determines height information by identifying the Z position at which the image Contrast is maximum
| Comparison of surface metrology techniques
each surface metrology technology OLS5500 by LEXT™ is uniquely positioned to help you explore the shape of your sample. appearance, texture and fine structure.
| Comparison of surface metrology techniques
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LEXT™OLS5500 a new generation of precision measurement Laser confocal microscope
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